EOS/ESD Symposium is the leading conference in the field of electrostatic discharge and electrical overstress. It offers the unique possibility to get…
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On Monday, June 10, Jon will present:
C6-4 - 15:15
A CMOS Temperature Stabilized 2-Dimensional Mechanical Stress Sensor with 11-bit Resolution,
U.…
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IEEE International Electron Devices Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of…
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In a project, sponsored by the Bavarian Ministry of Economic Affairs and Media, Energy and Technology, and controlled by VDI/ VDE Innovation + Technik…
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