news archive

EOS/ESD Symposium is the leading conference in the field of electrostatic discharge and electrical overstress. It offers the unique possibility to get… [weiterlesen]

Nature News & Views [weiterlesen]

On Monday, June 10, Jon will present: C6-4 - 15:15 A CMOS Temperature Stabilized 2-Dimensional Mechanical Stress Sensor with 11-bit Resolution, U.… [weiterlesen]

Sören Hommel successfully defended his dissertation "High Resolution Probing of Charge Carrier Properties in Semiconductor Device Materials".… [weiterlesen]

Highly Reliable Contacts to Silicon Enabled by Low Temperature Sputtered Graphenic Carbon [weiterlesen]

Finally officially announced ;-) Our development is in volume… [weiterlesen]

IEEE International Electron Devices Meeting (IEDM) is the world’s preeminent forum for reporting technological breakthroughs in the areas of… [weiterlesen]

In a project, sponsored by the Bavarian Ministry of Economic Affairs and Media, Energy and Technology, and controlled by VDI/ VDE Innovation + Technik… [weiterlesen]

Resolving Trap-caused Charges by Scanning Microwave Microscopy [weiterlesen]

Moritz will present "Graphenic Carbon Photodetectors" in N3 in room 5325 his talk on Thursday June 21, 2018 at 4:00 pm You are welcome to join this… [weiterlesen]