google scholar profile

google scholar

ORCID ID

Supervising & Tutoring

Supervising and Tutoring

MA: Master Thesis, BA: Bachelor Thesis, DA: Diploma Thesis,
FP: Forschungspraxis, IP: Ingenieurpraxis


Publications

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2019

  • Darwish, M.; Gagliardi, A.: A drift-diffusion simulation model for organic field effect transistors: On the importance of the Gaussian density of states and traps. Journal of Physics D: Applied Physics-122590.R1 2019-12, 2019, 1-11 more… BibTeX Full text ( DOI )

2018

  • Darwish, M.; Boysan, H.; Liewald, C.; Nickel, B.; Gagliardi, A.: A resistor network simulation model for laser-scanning photo-current microscopy to quantify low conductance regions in organic thin films. Organic Electronics Available online 7 August In Press, Accepted Manuscript 2018-08, 2018 more… BibTeX Full text ( DOI )

2017

  • Darwish, M.; Gagliardi, A.: Modelling and simulation of trap densities in organic thin films. IEEE 17th International Conference on Nanotechnology (IEEE-NANO), IEEE Xplore Digital Library, 2017Pittsburgh PA USA 25-28 July 2017-07 more… BibTeX Full text ( DOI )
  • Meister, T.; Ellinger, F.; Bartha, J.W.; Berroth, M.; Burghartz, J.; Claus, M.; Frey, L.; Gagliardi, A.; Grundmann, M.; Hesselbarth, J.; Klauk, H.; Leo, K.; Lugli, P.; Mannsfeld, S.; Manoli, Y.; Negra, R.; Neumaier, D.; Pfeiffer, U.; Riedl, T.; Scheinert, S.; Scherf, U.; Thiede, A.; Troster, G.; Vossiek, M.; Weigel, R.; Wenger, C.; Alavi, G.; Becherer, M.; Chavarin, C.A.; Darwish, M.; Ellinger, M.; Fan, C.-Y.; Fritsch, M.; Grotjahn, F.; Gunia, M.; Haase, K.; Hillger, P.; Ishida, K.; Jank, M.; Knobelspies, S.; Kuhl, M.; Lupina, G.; Naghadeh, S.M.; Munzenrieder, N.; Ozbek, S.; Rasteh, M.; Salvatore, G.A.; Schrufer, D.; Strobel, C.; Theisen, M. et al.: Program FFlexCom — High frequency flexible bendable electronics for wireless communication systems. IEEE International Conference on Microwaves, Antennas, Communications and Electronic Systems (COMCAS), IEEE Xplore Digital Library, 2017Tel Aviv, Israel, 13-15 Nov 2017-11, 1-6 more… BibTeX Full text ( DOI )